Customization: | Available |
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Warranty: | 3 Years |
Magnification: | 500-1000X |
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Darkfield (Wafer) Darkfield enables the observation of scattered or diffracted light from the specimen. Anything that is not flat reflects this light while anything that is flat appears dark so imperfections clearly stand out. The user can identify the existence of even a minute scratch or flaw down to the 8nm level-smaller than the resolving power limit of an optical microscope. Darkfield is ideal for detecting minute scratches or flaws on a specimen and examining mirror surface specimens, including wafers. |
Differential Interference Contrast (Conducting Particles) DIC is a microscopic observation technique in which the height difference of a specimen not detectable with brightfield becomes a relief-like or three- dimensional image with improved contrast. This technique utilizes polarized light and can be customized with a choice of three specially designed prisms. It is ideal for examining specimens with very minute height differences, including metallurgical structures, minerals, magnetic heads, hard-disk media and polished wafer surfaces. |
Transmitted Light Observation (LCD) For transparent specimen such as LCDs, plastics, and glass materials, transmitted light observation is available by using a variety of condensers. Examining specimen in transmitted brightfield and polarized light can be accomplished all in one convenient system. |
Polarized Light (Asbestos) This microscopic observation technique utilizes polarized light generated by a set of filters (analyzer and polarizer). The characteristics of the sample directly affect the intensity of the light reflected through the system. It is suitable for metallurgical structures (i.e., growth pattern of graphite on nodular casting iron), minerals, LCDs and semiconductor materials. |
Item | Specification | BS-6024RF | BS-6024TRF | |
Optical System | NIS45 Infinite Color Corrected Optical System (Tube length: 200mm) | * | * | |
Viewing Head | Ergo Tilting Trinocular Head, adjustable 0-35° inclined, interpupillary distance 47mm-78mm; splitting ratio Eyepiece:Trinocular=100:0 or 20:80 or 0:100 | * | * | |
Seidentopf Trinocular Head, 30° inclined, interpupillary distance: 47mm-78mm; splitting ratio Eyepiece:Trinocular=100:0 or 20:80 or 0:100 | ○ | ○ | ||
Seidentopf Binocular Head, 30° inclined, interpupillary distance: 47mm-78mm | ○ | ○ | ||
Eyepiece | Super wide field plan eyepiece SW10X/25mm, diopter adjustable | * | * | |
Super wide field plan eyepiece SW10X/22mm, diopter adjustable | ○ | ○ | ||
Extra wide field plan eyepiece EW12.5X/16mm, diopter adjustable | ○ | ○ | ||
Wide field plan eyepiece WF15X/16mm, diopter adjustable | ○ | ○ | ||
Wide field plan eyepiece WF20X/12mm, diopter adjustable | ○ | ○ | ||
Objective | NIS45 Infinite LWD Plan Semi-APO Objective (BF & DF) | 5X/NA=0.15, WD=20mm | * | * |
10X/NA=0.3, WD=11mm | * | * | ||
20X/NA=0.45, WD=3.0mm | * | * | ||
NIS45 Infinite LWD Plan APO Objective (BF & DF) | 50X/NA=0.8, WD=1.0mm | * | * | |
100X/NA=0.9, WD=1.0mm | * | * | ||
NIS60 Infinite LWD Plan Semi-APO Objective (BF) | 5X/NA=0.15, WD=20mm | ○ | ○ | |
10X/NA=0.3, WD=11mm | ○ | ○ | ||
20X/NA=0.45, WD=3.0mm | ○ | ○ | ||
NIS60 Infinite LWD Plan APO Objective (BF) | 50X/NA=0.8, WD=1.0mm | ○ | ○ | |
100X/NA=0.9, WD=1.0mm | ○ | ○ | ||
Nosepiece | Backward Sextuple Nosepiece (with DIC slot) | * | * | |
Condenser | LWD condenser N.A.0.65 | ○ | * | |
Transmitted Illumination | 24V/100W halogen lamp, Kohler illumination, with ND6/ND25 filter | ○ | * | |
3W S-LED lamp, center pre-set, intensity adjustable | ○ | ○ | ||
Reflected Illumination | Reflected light 24V/100W halogen lamp, Koehler illumination, with 6 position turret | * | * | |
100W halogen lamp house | * | * | ||
Reflected light with 5W LED lamp, Koehler illumination, with 6 position turret | ○ | ○ | ||
BF1 bright field module | ○ | ○ | ||
BF2 bright field module | * | * | ||
DF dark field module | * | * | ||
Built-in ND6, ND25 filter and color correction filter | ○ | ○ | ||
ECO Function | ECO function with ECO button | * | * | |
Focusing | Low-position coaxial coarse and fine focusing, fine division 1μm, Moving range 35mm | * | * | |
Max. Specimen Height | 76mm | * | ||
56mm | * | |||
Stage | Double layers mechanical stage, size 210mmX170mm; moving range 105mmX105mm (Right or left handle); precision: 1mm; with hard oxidized surface to prevent abrasion, Y direction could be locked | * | * | |
Wafer holder: could be used to hold 2", 3", 4" wafer | ○ | ○ | ||
DIC Kit | DIC Kit for reflected illumination (can be used for 10X, 20X, 50X, 100X objectives) | ○ | ○ | |
Polarizing Kit | Polarizer for reflected illumination | ○ | ○ | |
Analyzer for reflected illumination, 0-360° rotatable | ○ | ○ | ||
Polarizer for transmitted illumination | ○ | |||
Analyzer for transmitted illumination | ○ | |||
Other Accessories | 0.5X C-mount Adapter | ○ | ○ | |
1X C-mount Adapter | ○ | ○ | ||
Dust Cover | * | * | ||
Power Cord | * | * | ||
Calibration slide 0.01mm | ○ | ○ | ||
Specimen Presser | ○ | ○ |