Introduction
BSEM-320A is a high-performance tungsten filament scanning electron microscope. It has excellent imaging quality capabilities in both high and low vacuum modes. It also has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
Feature
1. Low Voltage
Carbon material specimens with shallow penetration depth at low voltage. The true topography of the specimen surface can be obtained with rich details.
The electron beam irradiation damage of the hair specimen is reduced at low voltage while the charge effect is eliminated.
2. Expandability
BSEM-320 has a large specimen chamber with an extensive interface: SEM SE\BSE\EDS\EDX\EBSD, etc.
3. Large Field of View
Biological specimens, using a large field of view observation, can easily obtain the overall morphology details of a ladybug's head, demonstrating cross-scale imaging ability.
4. Optical Navigation
Quickly locates targeted Region of Interest (ROI). Click where you want to go and see with easy navigation. An in-chamber camera is standard and can take HD photos to help locate specimens quickly.
5. Quick Gesture Navigation
Quick navigation by double-clicking to move, middle mouse button to drag, and frame to zoom.
Exp: Frame Zoom - to get a large view of the specimen with low magnification navigation, you can quickly frame the specimen area you are interested in, image zooms in automatically to improve efficiency.
6. Intelligence Assisted Image Astigmatism Correction
Visually display astigmatism within the entire field of view, and quickly adjust to correct by mouse clicking.
7. Auto Focus
One-button focus for fast imaging.
8. Automatic Stigmator
One-click astigmatism deduction to improve work efficiency.
9. Auto Brightness & Contrast
One-click auto brightness & contrast to tune appropriate images' grayscale.
10. Mixed Imaging (SE + BSE)
Observe the specimen compositional and surface topographic information in one image. The software supports one-click switching between SE and BSE for mixed imaging. Both morphological and compositional information of the specimen can be observed at the same time.
11. Fast Image Rotation Adjustment
Drag a line and release to rotate the image right on the spot.
12. Stage Anti-collision
A multi-way anti-collision solution:
Manually input specimen height: precisely control the distance between the specimen surface and the objective lens.
Image recognition and motion capture: monitor the real-time stage movement.
Hardware: shut down the stage motor at the moment of collision. (BSEM-320A requires this function as an optional feature)
13. Dual Anode (Tetrode)
Dual anode emission system design provides excellent resolution under low landing energy.
14. Low Vacuum Mode
Provides specimen surface morphology information in low vacuum, switchable vacuum state with one click.
Filtered fiber tube materials are poorly conductive and charge significantly in high vacuum. In the low vacuum, direct observation of non-conductive specimens can be achieved without coating.
Application
1. Semiconductors and Electronic Component.
2. Batteries and New Energy.
3. Polymer Materials.
4. Chemicals.
5. ETD Metal.
6. Biological.
7. Fundamental Research.
Specification
Note: * Standard outfits, ○ Optional.
Sample Image
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